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17-11-2006, 23:24
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Senior Member
Iscritto dal: Mar 2002
Città: (MI)
Messaggi: 1111
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smartctl - l'hd si sta per rompere?
Ho lanciato badblocks -v -b 4096 /dev/sda3 e ha trovato 2 bad blocks (401792 401836) nella partizione fat32 di windows (la dimensione dei blocchi però dovrebbe essere 16KB ma -b 16384 non lo prendeva). In quelle di Linux (ext3, reiserfs, etx2) no.
Codice:
# smartctl -d ata -a /dev/sda
smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar SE (Serial ATA) family
Device Model: WDC WD800JD-00JNA0
Serial Number: WD-WMAM94411446
Firmware Version: 05.01C05
User Capacity: 80,026,361,856 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 6
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Fri Nov 17 20:53:28 2006 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 121) The previous self-test completed having
the read element of the test failed.
Total time to complete Offline
data collection: (2460) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection
on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 35) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE
UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 200 200 051 Pre-fail
Always - 0
3 Spin_Up_Time 0x0003 166 165 021 Pre-fail
Always - 2666
4 Start_Stop_Count 0x0032 100 100 000 Old_age
Always - 700
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail
Always - 0
7 Seek_Error_Rate 0x000f 200 200 051 Pre-fail
Always - 0
9 Power_On_Hours 0x0032 099 099 000 Old_age
Always - 874
10 Spin_Retry_Count 0x0013 100 100 051 Pre-fail
Always - 0
11 Calibration_Retry_Count 0x0012 100 100 051 Old_age
Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age
Always - 698
194 Temperature_Celsius 0x0022 105 084 000 Old_age
Always - 38
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age
Always - 0
197 Current_Pending_Sector 0x0012 200 200 000 Old_age
Always - 1
198 Offline_Uncorrectable 0x0010 200 200 000 Old_age
Offline - 1
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age
Always - 0
200 Multi_Zone_Error_Rate 0x0009 200 200 051 Pre-fail
Offline - 0
SMART Error Log Version: 1
ATA Error Count: 4
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 4 occurred at disk power-on lifetime: 489 hours (20 days + 9 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 1f 48 76 dd 45 Error: UNC 31 sectors at LBA = 0x05dd7648 = 98399816
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 20 47 76 dd 05 68 00:04:39.760 READ DMA
c8 03 20 9c af d6 05 68 00:04:39.750 READ DMA
ca 03 01 46 a3 ac 05 68 00:04:39.750 WRITE DMA
ca 03 01 05 69 ac 05 68 00:04:39.745 WRITE DMA
c8 03 08 05 69 ac 05 68 00:04:39.740 READ DMA
Error 3 occurred at disk power-on lifetime: 489 hours (20 days + 9 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 1f 48 76 dd 45 Error: UNC 31 sectors at LBA = 0x05dd7648 = 98399816
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 20 47 76 dd 05 68 00:04:37.815 READ DMA
c8 03 20 27 83 dc 05 68 00:04:37.810 READ DMA
c8 03 0c 3b 9b dc 05 68 00:04:37.810 READ DMA
c8 03 13 27 9b dc 05 68 00:04:37.810 READ DMA
c8 03 0b 5c 8e dc 05 68 00:04:37.810 READ DMA
Error 2 occurred at disk power-on lifetime: 487 hours (20 days + 7 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 07 48 76 dd 45 Error: UNC 7 sectors at LBA = 0x05dd7648 = 98399816
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 9f 4a d7 05 68 00:00:37.355 READ DMA
c8 03 08 47 76 dd 05 68 00:00:35.455 READ DMA
c8 03 08 c7 89 02 06 68 00:00:35.445 READ DMA
c8 03 04 0c 84 ee 00 68 00:00:35.425 READ DMA
c8 03 38 47 64 d7 05 68 00:00:37.355 READ DMA
Error 1 occurred at disk power-on lifetime: 487 hours (20 days + 7 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 07 48 76 dd 45 Error: UNC 7 sectors at LBA = 0x05dd7648 = 98399816
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 e7 00 d2 05 68 00:00:34.965 READ DMA
c8 03 08 47 76 dd 05 68 00:00:32.900 READ DMA
c8 03 01 3f 00 00 00 68 00:00:32.885 READ DMA
c8 03 14 27 7c de 05 68 00:00:32.875 READ DMA
c8 03 40 87 df da 05 68 00:00:32.865 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining
LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed: read failure 90% 874
98399816
# 2 Short offline Completed: read failure 90% 874
98399816
# 3 Extended offline Completed: read failure 90% 872
98399816
# 4 Conveyance offline Completed: read failure 90% 872
98399816
# 5 Short offline Completed: read failure 80% 872
98399816
# 6 Short offline Completed: read failure 90% 872
98399816
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Codice:
# smartctl -F samsung2 -a /dev/hda
smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MP0804H
Serial Number: S042J10Y422350
Firmware Version: UE100-14
User Capacity: 80,060,424,192 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0
Local Time is: Fri Nov 17 23:09:32 2006 CET
==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 249) Self-test routine in progress...
90% of test remaining.
Total time to complete Offline
data collection: (4800) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0007 100 100 025 Pre-fail Always - 3328
4 Start_Stop_Count 0x0032 093 093 000 Old_age Always - 7602
5 Reallocated_Sector_Ct 0x0033 100 100 011 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0
8 Seek_Time_Performance 0x0025 100 100 015 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 288349
10 Spin_Retry_Count 0x0033 100 100 051 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1338
191 G-Sense_Error_Rate 0x0012 099 099 000 Old_age Always - 10605
194 Temperature_Celsius 0x0022 109 079 000 Old_age Always - 43
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 3139965
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 1
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x000a 100 100 051 Old_age Always - 0
201 Soft_Read_Error_Rate 0x0012 100 100 000 Old_age Always - 0
223 Load_Retry_Count 0x0012 100 100 000 Old_age Always - 15
225 Load_Cycle_Count 0x0012 054 054 000 Old_age Always - 472661
255 Unknown_Attribute 0x000a 100 100 051 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 768 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 768 occurred at disk power-on lifetime: 2402 hours (100 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 03 4f c2 e0 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d4 00 03 4f c2 e0 00 05:56:04.063 SMART EXECUTE OFF-LINE IMMEDIATE
b0 d1 01 01 4f c2 e0 00 05:56:04.063 SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
b0 d0 01 00 4f c2 e0 00 05:56:03.938 SMART READ DATA
b0 da 00 00 4f c2 00 00 05:56:03.875 SMART RETURN STATUS
b0 da 00 00 4f c2 e0 00 05:56:03.813 SMART RETURN STATUS
Error 767 occurred at disk power-on lifetime: 2402 hours (100 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 03 4f c2 e0 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d4 00 03 4f c2 e0 00 05:55:58.750 SMART EXECUTE OFF-LINE IMMEDIATE
b0 d1 01 01 4f c2 e0 00 05:55:58.688 SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
b0 d0 01 00 4f c2 e0 00 05:55:58.625 SMART READ DATA
b0 da 00 00 4f c2 00 00 05:55:58.563 SMART RETURN STATUS
b0 da 00 00 4f c2 e0 00 05:55:58.438 SMART RETURN STATUS
Error 766 occurred at disk power-on lifetime: 2402 hours (100 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 03 4f c2 e0 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d4 00 03 4f c2 e0 00 05:55:32.125 SMART EXECUTE OFF-LINE IMMEDIATE
b0 d1 01 01 4f c2 e0 00 05:55:32.125 SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
b0 d0 01 00 4f c2 e0 00 05:55:32.000 SMART READ DATA
b0 da 00 00 4f c2 00 00 05:55:31.938 SMART RETURN STATUS
b0 da 00 00 4f c2 e0 00 05:55:31.875 SMART RETURN STATUS
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 2402 -
# 2 Short offline Completed without error 00% 2402 -
# 3 Short offline Completed without error 00% 2402 -
# 4 Short offline Completed without error 00% 2402 -
SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data structure revision number = 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
__________________
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