mortimer7
12-03-2014, 10:11
Salve,
il mio computer monta un vecchio hard disk da 250GB del 2007. funziona ancora bene, però per sicurezza ho voluto provare ad effettuare uno "Short self-test" con GSMARTCONTROL (programma per Linux)
questo è l'output:
smartctl 6.2 2013-07-26 r3841 [i686-linux-3.10.12-100.fc18.i686] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Seagate Maxtor DiamondMax 21
Device Model: MAXTOR ------------
Serial Number: --------
Firmware Version: 3.AAE
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-7 (minor revision not indicated)
Local Time is: Wed Mar 12 11:05:40 2014 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 92) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 114 088 006 Pre-fail Always - 58770367
3 Spin_Up_Time 0x0003 096 095 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 095 095 020 Old_age Always - 6049
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 087 060 030 Pre-fail Always - 551794680
9 Power_On_Hours 0x0032 088 088 000 Old_age Always - 11146
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 095 095 020 Old_age Always - 6008
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 061 055 045 Old_age Always - 39 (Min/Max 25/39)
194 Temperature_Celsius 0x0022 039 045 000 Old_age Always - 39 (0 20 0 0 0)
195 Hardware_ECC_Recovered 0x001a 063 052 000 Old_age Always - 4263834
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 191 000 Old_age Always - 686
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 750 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 750 occurred at disk power-on lifetime: 10885 hours (453 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 6f 80 05 d4 e0 Error: ICRC, ABRT 111 sectors at LBA = 0x00d40580 = 13895040
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 ef 04 d4 e0 00 00:01:01.227 READ DMA EXT
25 00 00 ef 03 d4 e0 00 00:01:01.210 READ DMA EXT
25 00 00 ef 02 d4 e0 00 00:01:01.199 READ DMA EXT
25 00 00 ef 01 d4 e0 00 00:01:01.195 READ DMA EXT
25 00 00 ef 00 d4 e0 00 00:01:01.192 READ DMA EXT
Error 749 occurred at disk power-on lifetime: 10880 hours (453 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 fe 0e 60 e0 Error: ICRC, ABRT at LBA = 0x00600efe = 6295294
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 14 eb 0e 60 e0 00 00:00:29.457 READ DMA EXT
25 00 2c bf 0e 60 e0 00 00:00:29.457 READ DMA EXT
25 00 0a 2f 66 d0 e0 00 00:00:29.457 READ DMA EXT
25 00 04 2b 66 d0 e0 00 00:00:29.456 READ DMA EXT
25 00 3c ef 65 d0 e0 00 00:00:29.456 READ DMA EXT
Error 748 occurred at disk power-on lifetime: 10874 hours (453 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 15 c8 fb d0 e0 Error: ICRC, ABRT 21 sectors at LBA = 0x00d0fbc8 = 13695944
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d8 76 67 fb d0 e0 00 00:00:44.630 READ DMA EXT
25 d8 07 5f fb d0 e0 00 00:00:44.629 READ DMA EXT
25 d8 0c 4f fb d0 e0 00 00:00:44.628 READ DMA EXT
25 d8 3a e7 fa d0 e0 00 00:00:44.626 READ DMA EXT
25 d8 00 e7 f9 d0 e0 00 00:00:44.624 READ DMA EXT
Error 747 occurred at disk power-on lifetime: 9782 hours (407 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 40 00 60 e0 Error: ICRC, ABRT at LBA = 0x00600040 = 6291520
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 01 40 00 60 e0 00 00:09:42.171 READ DMA EXT
25 00 01 3f 00 60 e0 00 00:09:42.171 READ DMA EXT
25 00 01 4a 00 60 e0 00 00:09:42.171 READ DMA EXT
25 00 01 49 00 60 e0 00 00:09:42.171 READ DMA EXT
25 00 01 40 00 60 e0 00 00:09:42.171 READ DMA EXT
Error 746 occurred at disk power-on lifetime: 9782 hours (407 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 1f c8 a0 0f e0 Error: ICRC, ABRT 31 sectors at LBA = 0x000fa0c8 = 1024200
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 40 a7 a0 0f e0 00 00:08:24.237 READ DMA EXT
25 00 28 01 74 0c e0 00 00:08:24.237 READ DMA EXT
35 00 04 1f 01 0a e0 00 00:08:24.237 WRITE DMA EXT
25 00 07 df 7b 57 e0 00 00:08:23.848 READ DMA EXT
25 00 40 a7 a0 0f e0 00 00:08:26.127 READ DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 11146 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
qualcuno è in grado di "decodificare" tutto questo guazzabuglio di cifre e dirmi in che condizioni si trova l'hard disk?
Grazie.
il mio computer monta un vecchio hard disk da 250GB del 2007. funziona ancora bene, però per sicurezza ho voluto provare ad effettuare uno "Short self-test" con GSMARTCONTROL (programma per Linux)
questo è l'output:
smartctl 6.2 2013-07-26 r3841 [i686-linux-3.10.12-100.fc18.i686] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Seagate Maxtor DiamondMax 21
Device Model: MAXTOR ------------
Serial Number: --------
Firmware Version: 3.AAE
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-7 (minor revision not indicated)
Local Time is: Wed Mar 12 11:05:40 2014 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 92) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 114 088 006 Pre-fail Always - 58770367
3 Spin_Up_Time 0x0003 096 095 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 095 095 020 Old_age Always - 6049
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 087 060 030 Pre-fail Always - 551794680
9 Power_On_Hours 0x0032 088 088 000 Old_age Always - 11146
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 095 095 020 Old_age Always - 6008
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 061 055 045 Old_age Always - 39 (Min/Max 25/39)
194 Temperature_Celsius 0x0022 039 045 000 Old_age Always - 39 (0 20 0 0 0)
195 Hardware_ECC_Recovered 0x001a 063 052 000 Old_age Always - 4263834
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 191 000 Old_age Always - 686
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 750 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 750 occurred at disk power-on lifetime: 10885 hours (453 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 6f 80 05 d4 e0 Error: ICRC, ABRT 111 sectors at LBA = 0x00d40580 = 13895040
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 ef 04 d4 e0 00 00:01:01.227 READ DMA EXT
25 00 00 ef 03 d4 e0 00 00:01:01.210 READ DMA EXT
25 00 00 ef 02 d4 e0 00 00:01:01.199 READ DMA EXT
25 00 00 ef 01 d4 e0 00 00:01:01.195 READ DMA EXT
25 00 00 ef 00 d4 e0 00 00:01:01.192 READ DMA EXT
Error 749 occurred at disk power-on lifetime: 10880 hours (453 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 fe 0e 60 e0 Error: ICRC, ABRT at LBA = 0x00600efe = 6295294
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 14 eb 0e 60 e0 00 00:00:29.457 READ DMA EXT
25 00 2c bf 0e 60 e0 00 00:00:29.457 READ DMA EXT
25 00 0a 2f 66 d0 e0 00 00:00:29.457 READ DMA EXT
25 00 04 2b 66 d0 e0 00 00:00:29.456 READ DMA EXT
25 00 3c ef 65 d0 e0 00 00:00:29.456 READ DMA EXT
Error 748 occurred at disk power-on lifetime: 10874 hours (453 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 15 c8 fb d0 e0 Error: ICRC, ABRT 21 sectors at LBA = 0x00d0fbc8 = 13695944
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d8 76 67 fb d0 e0 00 00:00:44.630 READ DMA EXT
25 d8 07 5f fb d0 e0 00 00:00:44.629 READ DMA EXT
25 d8 0c 4f fb d0 e0 00 00:00:44.628 READ DMA EXT
25 d8 3a e7 fa d0 e0 00 00:00:44.626 READ DMA EXT
25 d8 00 e7 f9 d0 e0 00 00:00:44.624 READ DMA EXT
Error 747 occurred at disk power-on lifetime: 9782 hours (407 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 40 00 60 e0 Error: ICRC, ABRT at LBA = 0x00600040 = 6291520
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 01 40 00 60 e0 00 00:09:42.171 READ DMA EXT
25 00 01 3f 00 60 e0 00 00:09:42.171 READ DMA EXT
25 00 01 4a 00 60 e0 00 00:09:42.171 READ DMA EXT
25 00 01 49 00 60 e0 00 00:09:42.171 READ DMA EXT
25 00 01 40 00 60 e0 00 00:09:42.171 READ DMA EXT
Error 746 occurred at disk power-on lifetime: 9782 hours (407 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 1f c8 a0 0f e0 Error: ICRC, ABRT 31 sectors at LBA = 0x000fa0c8 = 1024200
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 40 a7 a0 0f e0 00 00:08:24.237 READ DMA EXT
25 00 28 01 74 0c e0 00 00:08:24.237 READ DMA EXT
35 00 04 1f 01 0a e0 00 00:08:24.237 WRITE DMA EXT
25 00 07 df 7b 57 e0 00 00:08:23.848 READ DMA EXT
25 00 40 a7 a0 0f e0 00 00:08:26.127 READ DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 11146 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
qualcuno è in grado di "decodificare" tutto questo guazzabuglio di cifre e dirmi in che condizioni si trova l'hard disk?
Grazie.