Questo e' il risultato ottenuto con il comando
smartctl, cosa ne pensate?
Codice:
ubuntu@ubuntu:~$ sudo smartctl -a /dev/sda1
smartctl 6.5 2016-01-24 r4214 [i686-linux-4.10.0-28-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Scorpio Blue Serial ATA (AF)
Device Model: WDC WD3200BPVT-80JJ5T0
Serial Number: WD-WXG1C12P5526
LU WWN Device Id: 5 0014ee 60286727d
Firmware Version: 01.01A01
User Capacity: 320.072.933.376 bytes [320 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Wed Feb 21 00:13:21 2018 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 246) Self-test routine in progress...
60% of test remaining.
Total time to complete Offline
data collection: ( 7500) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 76) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x7035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 140 139 021 Pre-fail Always - 1983
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 571
5 Reallocated_Sector_Ct 0x0033 168 168 140 Pre-fail Always - 274
7 Seek_Error_Rate 0x002e 186 164 000 Old_age Always - 1303
9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 781
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 544
191 G-Sense_Error_Rate 0x0032 001 001 000 Old_age Always - 458
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 60
193 Load_Cycle_Count 0x0032 174 174 000 Old_age Always - 79026
194 Temperature_Celsius 0x0022 105 093 000 Old_age Always - 38
196 Reallocated_Event_Count 0x0032 138 123 000 Old_age Always - 62
197 Current_Pending_Sector 0x0032 001 001 000 Old_age Always - 65527
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
SMART Error Log Version: 1
Warning: ATA error count 25771 inconsistent with error log pointer 4
ATA Error Count: 25771 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 25771 occurred at disk power-on lifetime: 781 hours (32 days + 13 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 02 00 00 00 a0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 10 02 00 00 00 a0 00 05:54:10.762 SET FEATURES [Enable SATA feature]
ec 00 00 00 00 00 a0 00 05:54:10.761 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 00 05:54:10.760 SET FEATURES [Set transfer mode]
ef 10 02 00 00 00 a0 00 05:54:10.760 SET FEATURES [Enable SATA feature]
ec 00 00 00 00 00 a0 00 05:54:10.759 IDENTIFY DEVICE
Error 25770 occurred at disk power-on lifetime: 781 hours (32 days + 13 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 46 00 00 00 a0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 03 46 00 00 00 a0 00 05:54:10.760 SET FEATURES [Set transfer mode]
ef 10 02 00 00 00 a0 00 05:54:10.760 SET FEATURES [Enable SATA feature]
ec 00 00 00 00 00 a0 00 05:54:10.759 IDENTIFY DEVICE
c8 00 08 78 70 00 e0 00 05:54:10.743 READ DMA
ef 10 02 00 00 00 a0 00 05:54:10.742 SET FEATURES [Enable SATA feature]
Error 25769 occurred at disk power-on lifetime: 781 hours (32 days + 13 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 02 00 00 00 a0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 10 02 00 00 00 a0 00 05:54:10.760 SET FEATURES [Enable SATA feature]
ec 00 00 00 00 00 a0 00 05:54:10.759 IDENTIFY DEVICE
c8 00 08 78 70 00 e0 00 05:54:10.743 READ DMA
ef 10 02 00 00 00 a0 00 05:54:10.742 SET FEATURES [Enable SATA feature]
ec 00 00 00 00 00 a0 00 05:54:10.741 IDENTIFY DEVICE
Error 25768 occurred at disk power-on lifetime: 781 hours (32 days + 13 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 08 78 70 00 e0 Device Fault; Error: ABRT 8 sectors at LBA = 0x00007078 = 28792
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 78 70 00 e0 00 05:54:10.743 READ DMA
ef 10 02 00 00 00 a0 00 05:54:10.742 SET FEATURES [Enable SATA feature]
ec 00 00 00 00 00 a0 00 05:54:10.741 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 00 05:54:10.740 SET FEATURES [Set transfer mode]
ef 10 02 00 00 00 a0 00 05:54:10.740 SET FEATURES [Enable SATA feature]
Error 25767 occurred at disk power-on lifetime: 781 hours (32 days + 13 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 02 00 00 00 a0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 10 02 00 00 00 a0 00 05:54:10.742 SET FEATURES [Enable SATA feature]
ec 00 00 00 00 00 a0 00 05:54:10.741 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 00 05:54:10.740 SET FEATURES [Set transfer mode]
ef 10 02 00 00 00 a0 00 05:54:10.740 SET FEATURES [Enable SATA feature]
ec 00 00 00 00 00 a0 00 05:54:10.738 IDENTIFY DEVICE
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.