mortimer7
25-11-2021, 12:02
Ciao, ho raccatato un vecchio hard disk e facendo il test S.M.A.R.T. mi dice che ha 18622 ore di utilizzo (circa 2 anni).
È un dato affidabile? Mi pare strano che sia stato usato così poco visto che ha avrà 10 anni.
Questo è il log smart:
$ sudo smartctl -a /dev/sdb
smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.10.73-1-lts] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.10
Device Model: ST3250620AS
Serial Number: CENSURED
Firmware Version: 3.AAD
User Capacity: 250.059.350.016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-7 (minor revision not indicated)
Local Time is: Thu Nov 25 11:12:19 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 92) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 117 088 006 Pre-fail Always - 165929700
3 Spin_Up_Time 0x0003 095 095 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 097 097 020 Old_age Always - 3842
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 065 060 030 Pre-fail Always - 773578043236
9 Power_On_Hours 0x0032 079 079 000 Old_age Always - 18622
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 096 096 020 Old_age Always - 4166
187 Reported_Uncorrect 0x0032 086 086 000 Old_age Always - 14
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 064 044 045 Old_age Always In_the_past 36 (Min/Max 23/39)
194 Temperature_Celsius 0x0022 036 056 000 Old_age Always - 36 (0 12 0 0 0)
195 Hardware_ECC_Recovered 0x001a 059 051 000 Old_age Always - 172792457
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 14 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 14 occurred at disk power-on lifetime: 18552 hours (773 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 58 0d fe e0 Error: UNC at LBA = 0x00fe0d58 = 16649560
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 01 58 0d fe e0 00 01:10:41.410 READ DMA EXT
25 00 01 57 0d fe e0 00 01:10:41.410 READ DMA EXT
25 00 01 56 0d fe e0 00 01:10:41.410 READ DMA EXT
25 00 01 55 0d fe e0 00 01:10:41.410 READ DMA EXT
25 00 01 54 0d fe e0 00 01:10:41.410 READ DMA EXT
Error 13 occurred at disk power-on lifetime: 18552 hours (773 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 58 0d fe e0 Error: UNC at LBA = 0x00fe0d58 = 16649560
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 c0 20 0d fe e0 00 01:10:38.822 READ DMA EXT
25 00 b6 80 84 d5 e0 00 01:10:38.821 READ DMA EXT
25 00 00 80 83 d5 e0 00 01:10:38.815 READ DMA EXT
35 00 16 30 08 d8 e0 00 01:10:38.812 WRITE DMA EXT
35 00 00 30 07 d8 e0 00 01:10:38.811 WRITE DMA EXT
Error 12 occurred at disk power-on lifetime: 10703 hours (445 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 f6 1a 9e e0 Error: UNC at LBA = 0x009e1af6 = 10361590
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 28 ef 1a 9e e0 00 00:02:51.767 READ DMA EXT
35 00 08 47 00 5e e0 00 00:02:51.767 WRITE DMA EXT
25 00 30 e7 1a 9e e0 00 00:02:51.767 READ DMA EXT
35 00 10 97 a0 61 e0 00 00:02:51.743 WRITE DMA EXT
35 00 20 57 f1 5f e0 00 00:02:57.700 WRITE DMA EXT
Error 11 occurred at disk power-on lifetime: 10703 hours (445 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 f6 1a 9e e0 Error: UNC at LBA = 0x009e1af6 = 10361590
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 30 e7 1a 9e e0 00 00:02:51.767 READ DMA EXT
35 00 10 97 a0 61 e0 00 00:02:51.767 WRITE DMA EXT
35 00 20 57 f1 5f e0 00 00:02:51.767 WRITE DMA EXT
25 00 01 00 00 00 e0 00 00:02:51.743 READ DMA EXT
25 00 40 c1 e2 91 e0 00 00:02:51.726 READ DMA EXT
Error 10 occurred at disk power-on lifetime: 10703 hours (445 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 f6 1a 9e e0 Error: UNC at LBA = 0x009e1af6 = 10361590
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 38 df 1a 9e e0 00 00:02:51.767 READ DMA EXT
35 00 08 47 9b 61 e0 00 00:02:51.767 WRITE DMA EXT
25 00 10 01 d2 8e e0 00 00:02:51.767 READ DMA EXT
35 00 08 3f 3e 8e e0 00 00:02:51.743 WRITE DMA EXT
25 00 40 d7 1a 9e e0 00 00:02:51.726 READ DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 18622 -
# 2 Short offline Completed without error 00% 18605 -
# 3 Short offline Completed without error 00% 18604 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay
È un dato affidabile? Mi pare strano che sia stato usato così poco visto che ha avrà 10 anni.
Questo è il log smart:
$ sudo smartctl -a /dev/sdb
smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.10.73-1-lts] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.10
Device Model: ST3250620AS
Serial Number: CENSURED
Firmware Version: 3.AAD
User Capacity: 250.059.350.016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-7 (minor revision not indicated)
Local Time is: Thu Nov 25 11:12:19 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 92) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 117 088 006 Pre-fail Always - 165929700
3 Spin_Up_Time 0x0003 095 095 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 097 097 020 Old_age Always - 3842
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 065 060 030 Pre-fail Always - 773578043236
9 Power_On_Hours 0x0032 079 079 000 Old_age Always - 18622
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 096 096 020 Old_age Always - 4166
187 Reported_Uncorrect 0x0032 086 086 000 Old_age Always - 14
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 064 044 045 Old_age Always In_the_past 36 (Min/Max 23/39)
194 Temperature_Celsius 0x0022 036 056 000 Old_age Always - 36 (0 12 0 0 0)
195 Hardware_ECC_Recovered 0x001a 059 051 000 Old_age Always - 172792457
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 14 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 14 occurred at disk power-on lifetime: 18552 hours (773 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 58 0d fe e0 Error: UNC at LBA = 0x00fe0d58 = 16649560
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 01 58 0d fe e0 00 01:10:41.410 READ DMA EXT
25 00 01 57 0d fe e0 00 01:10:41.410 READ DMA EXT
25 00 01 56 0d fe e0 00 01:10:41.410 READ DMA EXT
25 00 01 55 0d fe e0 00 01:10:41.410 READ DMA EXT
25 00 01 54 0d fe e0 00 01:10:41.410 READ DMA EXT
Error 13 occurred at disk power-on lifetime: 18552 hours (773 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 58 0d fe e0 Error: UNC at LBA = 0x00fe0d58 = 16649560
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 c0 20 0d fe e0 00 01:10:38.822 READ DMA EXT
25 00 b6 80 84 d5 e0 00 01:10:38.821 READ DMA EXT
25 00 00 80 83 d5 e0 00 01:10:38.815 READ DMA EXT
35 00 16 30 08 d8 e0 00 01:10:38.812 WRITE DMA EXT
35 00 00 30 07 d8 e0 00 01:10:38.811 WRITE DMA EXT
Error 12 occurred at disk power-on lifetime: 10703 hours (445 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 f6 1a 9e e0 Error: UNC at LBA = 0x009e1af6 = 10361590
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 28 ef 1a 9e e0 00 00:02:51.767 READ DMA EXT
35 00 08 47 00 5e e0 00 00:02:51.767 WRITE DMA EXT
25 00 30 e7 1a 9e e0 00 00:02:51.767 READ DMA EXT
35 00 10 97 a0 61 e0 00 00:02:51.743 WRITE DMA EXT
35 00 20 57 f1 5f e0 00 00:02:57.700 WRITE DMA EXT
Error 11 occurred at disk power-on lifetime: 10703 hours (445 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 f6 1a 9e e0 Error: UNC at LBA = 0x009e1af6 = 10361590
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 30 e7 1a 9e e0 00 00:02:51.767 READ DMA EXT
35 00 10 97 a0 61 e0 00 00:02:51.767 WRITE DMA EXT
35 00 20 57 f1 5f e0 00 00:02:51.767 WRITE DMA EXT
25 00 01 00 00 00 e0 00 00:02:51.743 READ DMA EXT
25 00 40 c1 e2 91 e0 00 00:02:51.726 READ DMA EXT
Error 10 occurred at disk power-on lifetime: 10703 hours (445 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 f6 1a 9e e0 Error: UNC at LBA = 0x009e1af6 = 10361590
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 38 df 1a 9e e0 00 00:02:51.767 READ DMA EXT
35 00 08 47 9b 61 e0 00 00:02:51.767 WRITE DMA EXT
25 00 10 01 d2 8e e0 00 00:02:51.767 READ DMA EXT
35 00 08 3f 3e 8e e0 00 00:02:51.743 WRITE DMA EXT
25 00 40 d7 1a 9e e0 00 00:02:51.726 READ DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 18622 -
# 2 Short offline Completed without error 00% 18605 -
# 3 Short offline Completed without error 00% 18604 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay